Measuring Patent Similarity with Word Embedding and Statistical Features

Yan Yu,Lei Chen,Jinde Jiang,Naixuan Zhao

Data Analysis and Knowledge Discovery ›› 2019, Vol. 3 ›› Issue (9) : 53-59.

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Data Analysis and Knowledge Discovery ›› 2019, Vol. 3 ›› Issue (9) : 53-59. DOI: 10.11925/infotech.2096-3467.2018.1317

Measuring Patent Similarity with Word Embedding and Statistical Features

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2019, 3(9): 53-59 https://doi.org/10.11925/infotech.2096-3467.2018.1317

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