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Measuring Tech-Entropy of System Evolution: An Empirical Study of Patents |
Jianhua Hou1,3(),Pan Liu2,3 |
1School of Information Management, Sun Yat-Sen University, Guangzhou 510006, China 2School of Economics and Management, Dalian University, Dalian 116622, China 3Key Laboratory of Cross Border Electricity and Data Science in Liaoning Province, Dalian 116622, China |
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Abstract [Objective] This paper measures the developments and the life cycles of the technology system with an improved technology entropy method, aiming to provide theoretical foundation for predicting technology development and decision-making of the governments. [Methods] We constructed a model measuring technological entropy based on information entropy and multiple indicators for the patented technology system. Then, we conducted an empirical analysis with the new model for carbon capture technology in China. [Results] We found that the target technology concluded the stages of sprouting, and slow growth. It is currently in the stage of rapid growth. [Limitations] The quality of the sample data needs to be improved. [Conclusions] The proposed method is an effective way to analyze the evolution trends of patent technology system, which provides a better solution for identifying the life cycle of technologies.
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Received: 25 August 2018
Published: 29 September 2019
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Corresponding Authors:
Jianhua Hou
E-mail: houjh5@mail.sysu.edu.cn
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