Measuring Tech-Entropy of System Evolution: An Empirical Study of Patents

Jianhua Hou,Pan Liu

Data Analysis and Knowledge Discovery ›› 2019, Vol. 3 ›› Issue (8) : 21-29.

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Data Analysis and Knowledge Discovery ›› 2019, Vol. 3 ›› Issue (8) : 21-29. DOI: 10.11925/infotech.2096-3467.2018.0904

Measuring Tech-Entropy of System Evolution: An Empirical Study of Patents

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2019, 3(8): 21-29 https://doi.org/10.11925/infotech.2096-3467.2018.0904

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